Detailed analysis of the performance of RF amplifiers based on new instruments for accurate measurement of EVM

In wireless communication devices, phase and amplitude distortion caused by power amplifiers significantly affects the quality of the transmitted signal. In modern communication systems, one of the most critical metrics for evaluating power amplifier performance is the Error Vector Magnitude (EVM). EVM measures how accurately a power amplifier modulates signals in terms of both phase and amplitude. It serves as a key indicator of the fidelity of the RF signal being transmitted, allowing engineers to assess the internal behavior of the communication link. On the receiver side, EVM reflects the quality of the demodulated signal, helping to identify any degradation that may have occurred during transmission. As new communication standards continue to evolve, incorporating advanced modulation techniques and complex signal protocols, RF test instruments must adapt to these changes. Modern RF instruments now rely on software-defined radio (SDR) architectures to support a wide range of signal types and modulation schemes. These instruments must be flexible enough to generate and analyze various modulated signals while switching between different formats quickly. This flexibility is essential for accurately measuring EVM across multiple modulation types, ensuring comprehensive characterization of RF amplifier performance. A basic communication system consists of an input signal—either voice or data—that is processed digitally in most modern systems, making the entire system effectively digital. The power amplifier, located at the final stage of the transmitter, plays a crucial role in maintaining signal integrity. Any distortion introduced at this stage directly impacts the overall communication quality. To achieve optimal performance, power amplifiers are often operated near their maximum linear output power. However, when the power exceeds this point, it enters the gain compression region, which can distort the signal, especially with high peak-to-average ratio (PAPR) modulation schemes like OFDM. Designers must carefully manage the operating point to prevent signal clipping and maintain signal integrity. Beyond the power amplifier, other components such as the modulation module, preamplifier, downconverter, and demodulator also contribute to EVM errors. These elements introduce amplitude and phase offsets, carrier leakage, and other imperfections that affect signal quality. EVM is a fundamental metric used to evaluate the accuracy of digital modulation in wireless systems. It quantifies the difference between the ideal I (in-phase) and Q (quadrature) components of a reference signal and the actual measured I and Q components of the received signal. This measurement is performed for every symbol, providing a detailed insight into the signal’s quality. Unlike eye diagrams or bit error rate (BER) tests, EVM offers a faster and more informative approach to signal assessment. It is closely related to SNR and SNDR, making it a valuable tool for identifying specific issues within the communication chain. In an EVM measurement setup, a device under test (DUT), such as a power amplifier compliant with GSM/EDGE standards, is evaluated. A vector signal generator (VSG) is used to create the desired RF signal with specific frequency, amplitude, and modulation characteristics. The signal is then passed through the DUT and analyzed using a vector signal analyzer (VSA), which calculates the EVM. Both the VSG and VSA are synchronized via a shared reference clock to eliminate frequency drift and improve measurement speed. The instruments are connected to a computer via LAN or GPIB ports for remote control. In a typical measurement scenario, the frequency is fixed at 500 MHz, while the input power is varied from -40 dBm to -20 dBm in 0.1 dB steps, resulting in 201 measurement points. Each step takes 200 ms, and for each point, the EVM is averaged over 20 measurements. The modulation type used is 8PSK EDGE, and the DC bias remains constant throughout the test. The results show the relationship between EVM and input power. As the power increases, the amplifier's gain initially remains stable but begins to decrease at around -28 dBm. At -23.5 dBm, the gain drops by 1 dB, and at -20 dBm, it decreases by 3 dB. The EVM curve illustrates how the error increases rapidly once the amplifier enters the gain compression region. In the linear region, EVM remains below 1%, but it jumps to about 20% at the 1 dB compression point and exceeds 40% at the 3 dB compression point. This highlights the importance of accurate EVM measurements in assessing the performance of RF components under varying conditions.

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